1.

Conference Proceedings
Conference Proceedings
1. Performance comparisons of planar and volumetric observers for lesion detection in PET scanning
Kim, J.-S. ; Kinahan, P.E. ; Lartizien, C. ; Comtat, C. ; Lewellen, T.K.
Pub. info.: Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA.  pp.89-99,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5034
2.

Conference Proceedings
Conference Proceedings
2. Effect of Compaction Pressure on the Microstructure Evolution of Anode Substrate for SOFC Application
Kim, S.-W. ; Lee, J.-H. ; Song, H.-S. ; Kim, J.-S. ; Lee, H.-W.
Pub. info.: Eco-materials processing & design : ISEPD-4, proceedings of the 4th International Symposium on Eco-Materials Processing & Design, Gyungpodae, Korea, February 4-6, 2003.  pp.125-130,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 439
3.

Conference Proceedings
Conference Proceedings
3. Surface relief grating formation on an azo-polymer
Hwang, U.-J. ; Kim, J.-S. ; You, S.-Y. ; Lee, H.-K. ; Oh, C.-H. ; Song, S.-H. ; Kim, P.-S. ; Han, Y.-K.
Pub. info.: Linear and Nonlinear Optics of Organic Materials III.  pp.308-317,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5212
4.

Conference Proceedings
Conference Proceedings
4. Sub-100-nm DRAM cell patterning results and relation with lens aberration at 248-nm lithography era
You, T.-J. ; Kim, H.S. ; Kim, J.-S. ; Kim, S.-K. ; Kim, Y.-D. ; Youn, H.S. ; Kong, K.-K.
Pub. info.: Optical Microlithography XVI.  Part Three  pp.1327-1334,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
5.

Conference Proceedings
Conference Proceedings
5. Fabrication of multimode polymeric waveguides and micromirrors using UV and X-ray lithography
Kim, J.-S. ; Kang, J.-W. ; Kim, J.-J.
Pub. info.: Organic Photonic Materials and Devices V.  pp.398-405,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4991
6.

Conference Proceedings
Conference Proceedings
6. Printing 95-nm DRAM full chip patterns in KrF lithography
Kim, S.-K. ; Kim, J.-S. ; Yoo, T.-J. ; Kong, K.-K. ; Yun, H.-S. ; Kim, Y.-D. ; Kim, H.-R. ; Kim, Y.-S. ; Kim, H.S.
Pub. info.: Optical Microlithography XVI.  Part Three  pp.1321-1326,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
7.

Conference Proceedings
Conference Proceedings
7. Analysis of total CD uniformity at sub-100-nm DRAM patterning by using KrF lithography
Kim, Y.-S. ; You, T.J. ; Kim, J.-S. ; Kim, S.-K. ; Kong, K.-K. ; Kim, Y.-D. ; Kim, H.S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.1107-1113,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
8.

Conference Proceedings
Conference Proceedings
8. Effects of quencher ability on profile in chemically amplified resist system
Kim, D. ; Kim, H.-J. ; Cho, S.-H. ; Lee, D.-H. ; Im, K.-H. ; Yoo, M.-J. ; Lee, S.-H. ; Kim, J. ; Kim, J.-S. ; Kim, H.-S.
Pub. info.: Advances in Resist Technology and Processing XX.  2  pp.1086-1097,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5039
9.

Conference Proceedings
Conference Proceedings
9. Effects of alkali treatment on ArF resist process
Kim, J.-S. ; Jung, J.-C. ; Kong, K.-K. ; Kim, H.-R. ; Kim, H.-S.
Pub. info.: Advances in Resist Technology and Processing XX.  2  pp.761-769,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5039