1.

Conference Proceedings
Conference Proceedings
1. THE EFFECT OF STARTING SILICON CRYSTAL STRUCTURE ON PHOTOLUMINESCENCE INTENSITY OF POROUS SILICON
Dubbelday, W. B. ; Russell, S. D. ; Kavanagh, K. L.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.351-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
2.

Conference Proceedings
Conference Proceedings
2. LIGHT SCATTERING STUDY OF THE EVOLUTION OF THE SURFACE MORPHOLOGY DURING GROWTH OF InGaAs ON GaAs
Lavoie, C. ; Haveman, B. ; Nodwell, E. ; Pinnington, T. ; Tiedje, T. ; Goldman, R. S. ; Kavanagh, K. L. ; Hutter, J. L. ; Bechhoefer, J.
Pub. info.: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.193-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 375
3.

Conference Proceedings
Conference Proceedings
3. Effects of Substrate Misorientati n Direction on Strain Relaxation at InGaAs/GaAs(001) Interfaces
Goldman, R. S. ; Wieder, H. H. ; Kavanagh, K. L.
Pub. info.: Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A..  pp.21-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 379
4.

Conference Proceedings
Conference Proceedings
4. Structural and Magnetic Characterization of Bi-Substituted Garnet on Si and GaAs
Ring, Ken M. ; Shapiro, A. L. ; Deng, F. ; Goldman, R. S. ; Spada, F. ; Hellman, F. ; Cheeks, T. L. ; Kavanagh, K. L. ; Suzuki, Takao
Pub. info.: Magnetic ultrathin films, multilayers and surfaces : symposium held April 17-20, 1995, San Francisco, California, U.S.A..  pp.41-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 384
5.

Conference Proceedings
Conference Proceedings
5. Structural and Electrical Characterization of Si-Implanted TiN as a Diffusion Barrier for Cu Metallization
McArthur, W. F. ; Ring, K. M. ; Kavanagh, K. L.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.327-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391