Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA. pp.29-36, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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A collection of technical papers : AIAA Guidance, Navigation and Control Conference, Monterey, California, 5-8 August 2002. Pt. 2 pp.884-890, 2002. Reston, VA. American Institute of Aeronautics and Astronautics
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AIAA Paper : AIAA Guidance Navigation and Control Conference
A collection of technical papers : AIAA Guidance, Navigation and Control Conference, Austin, Texas, 11-14 August 2003. v. 3 pp.1751-1760, 2003. Reston, Va.. American Institute of Aeronautics and Astronautics
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AIAA Paper : AIAA Guidance Navigation and Control Conference
Metrology, Inspection, and Process Control for Microlithography XX. pp.61520E-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering