1.

Conference Proceedings
Conference Proceedings
1. Material testing of laser welds and claddings using digital speckle photography
Holstein,D. ; Juptner,W.P.
Pub. info.: Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Florianópolis, Brazil.  pp.51-58,  1999.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4420
2.

Conference Proceedings
Conference Proceedings
2. New light sources and sensors for active optical 3D inspection
Osten,W. ; Juptner,W.P.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.314-327,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
3.

Conference Proceedings
Conference Proceedings
3. Light-in-flight measurements by digital holography
Juptner,W.P. ; Pomarico,J.A. ; Schnars,U.
Pub. info.: Laser interferometry VIII--techniques and analysis : 6-7 August, 1996, Denver Colorado.  pp.135-141,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2860
4.

Conference Proceedings
Conference Proceedings
4. NDT on wide-scale aircraft structures with digital speckle shearography
Kalms,M.K. ; Osten,W. ; Juptner,W.P. ; Bisle,W. ; Scherling,D. ; Tober,G.
Pub. info.: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.280-286,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3824
5.

Conference Proceedings
Conference Proceedings
5. Application of digital speckle photography for local strain analysis
Holstein,D. ; Theiler,C. ; Hartmann,H.-J. ; Juptner,W.P.
Pub. info.: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.229-236,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3824
6.

Conference Proceedings
Conference Proceedings
6. Modern approaches for absolute phase measurement
Osten,W. ; Andra,P. ; Nadeborn,W. ; Juptner,W.P.
Pub. info.: International Conference on Holography and Correlation Optics : 15-19 May 1995, Chernovtsy, Ukraine.  pp.529-540,  1995.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2647
7.

Conference Proceedings
Conference Proceedings
7. Optical inspection of large-scale technical components
Juptner,W.P. ; Osten,W. ; Kalms,M.K.
Pub. info.: Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany.  pp.210-216,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3824
8.

Conference Proceedings
Conference Proceedings
8. Automatic adaption of projected fringe patterns using a programmable LCD projector
Kalms,M.K. ; Juptner,W.P. ; Osten,W.
Pub. info.: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.156-165,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3100
9.

Conference Proceedings
Conference Proceedings
9. General appriach for the description of optical 3D measuring systems
Andra,P. ; Juptner,W.P. ; Kebbel,V. ; Osten,W.
Pub. info.: Videometrics V : 30-31 July 1997, San Diego, California.  pp.207-215,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3174