1.

Conference Proceedings
Conference Proceedings
1. Defects in neutron-irradiated LEC semi-insulating-GaAs
Jones,B.K. ; Santana,J.M. ; Sloan,T.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1039-1044,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Traps found in GaAs MESFETS:properties,location and detection
Jones,B.K. ; Iqbal,M.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.933-938,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Generating composite filters for coupled SLMs
Jones,B.K.
Pub. info.: Materials, Devices, and Systems for Optoelectronic Processing.  pp.29-38,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2848
4.

Conference Proceedings
Conference Proceedings
4. Optical aided target recognition system
Kirsch,J.C. ; Jones,B.K. ; Booth,J.J. ; Duffey,J.N. ; Loudin,J.A. ; Sloan,J.A.
Pub. info.: Materials, Devices, and Systems for Optoelectronic Processing.  pp.10-19,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2848
5.

Conference Proceedings
Conference Proceedings
5. Optical image correlation using high-speed multiple quantum well spatial light modulators
Kang,K. ; Powell,J.S. ; Stack,R.D. ; Garvin,C.G. ; Trezza,J.A. ; Sanders ; Kirsch,J.C. ; Jones,B.K.
Pub. info.: Optical Pattern Recognition X.  pp.97-107,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3715
6.

Conference Proceedings
Conference Proceedings
6. New architectures and components for optical target recognition at the U.S.Army Aviation and Missile Command
Kirsch,J.C. ; Jones,B.K. ; Crowe,W.M.
Pub. info.: Optical Pattern Recognition X.  pp.228-235,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3715