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Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000S-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3741-3744, 2005. Uetikon-Zuerich. Trans Tech Publications
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3757-3760, 2005. Uetikon-Zuerich. Trans Tech Publications
Integrative and interdisciplinary aspects of intermetallics : symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A.. pp.139-144, 2005. Warrendale, Pa.. Materials Research Society
Nepal, N. ; Nam, K.B. ; Li, J. ; Lin, J.Y. ; Jiang, H.
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Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX. pp.119-125, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wu, Z. ; Din, Q. ; Jiang, H. ; Zen, J. ; Yu, J. ; Zhang, Y.
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2004 Shanghai International Conference on Laser Medicine and Surgery. pp.59671W-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality. pp.599612-599612, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering