1.

Conference Proceedings
Conference Proceedings
1. PRE-OXIDATION ANNEAL KINETICS: INTERFACE DEGRADATION OF THIN SiO2 FILMS ON SILICON
Poler, J.C. ; Irene, E.A.
Pub. info.: Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A..  pp.93-98,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 259
2.

Conference Proceedings
Conference Proceedings
2. PUMP-PROBE CHARGE INTEGRATING INVESTIGATION OF TRAP EMISSION KINETICS IN ULTRATHIN MOS CAPACITORS
Poler, J.C. ; Irene, E.A.
Pub. info.: Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A..  pp.241-246,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 284
3.

Conference Proceedings
Conference Proceedings
3. Thermal And Electron Cyclotron Resonance Plasma Oxidation Studies of Gallium Arsenide (GaAs)
Lefebvre, P.R. ; Zhao, C. ; Irene, E.A.
Pub. info.: Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors.  pp.262-274,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-2
4.

Conference Proceedings
Conference Proceedings
4. MICROROUGHNESS AT THE Si/SiO2 INTERFACE FROM PREOXIDATION ANNEALING, MEASURED USING QUANTUM OSCILLATIONS IN FOWLER NORDHEIM TUNNELING CURRENTS
Poler, J.C. ; McKay, K.K. ; Irene, E.A.
Pub. info.: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.139-142,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 280
5.

Conference Proceedings
Conference Proceedings
5. A Measurement of the Refractive Index of Ultrathin SiO2 Films and a Reevaluation of the Thermal Si Oxidation Kinetics in the Thin Film Regime
Hebert, K.J. ; Labayen, T. ; Irene, E.A.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.81-96,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1