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Conference Proceedings

1. Refractive index of SiO2 thin films deposited by pulsed-laser deposition with silicone targets for fabricating waveguide device

Okoshi, M. ; Kuramatsu, M. ; Takao, H. ; Inoue, N.

Pub. info.:	Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.250-254, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4830

Conference Proceedings

2. Decomposition of methylene blue with photocatalytic TiO2 thin films deposited by pulsed-laser deposition

Okoshi, M. ; Kosuge Y. ; Inoue, N. ; Yamashita, T.

Pub. info.:	Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.265-269, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4830

Conference Proceedings

3. INVITED: MEASUREMENT OF NITROGEN CONTENTRATION IN CZ SILICON

Inoue, N. ; Shingu, K. ; Masumoto, K.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.875-888, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

4. Valence Force Field Analysis of Nitrogen in Silicon

Harada, H. ; Tanahashi, K. ; Koukitsu, A. ; Mikayama, T. ; Inoue, N.

Pub. info.:	High Purity Silicon VI : proceedings of the sixth International Symposium. pp.97-104, 2000. Bellingham, Wash.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-17

Conference Proceedings

5. Nucleation of Void Defects in Cz Silicon

Yamanaka, Y. ; Tanahashi, K. ; Mikayama, T. ; Inoue, N. ; Mon, A.

Pub. info.:	High Purity Silicon VI : proceedings of the sixth International Symposium. pp.77-85, 2000. Bellingham, Wash.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-17

Conference Proceedings

6. Measurement of Nitrogen Concentration in CZ-Si below 1014/cm3 by IR Absorption Spectroscopy

Nakatsu, M. ; Hashimoto, A. ; Natsume, A. ; Inoue, N. ; Ono, H.

Pub. info.:	High purity silicon VIII : proceedings of the international symposium. pp.102-108, 2004. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-05

Conference Proceedings

7. INVITED: MEASUREMENT OF NITROGEN CONTENTRATION IN CZ SILICON

Inoue, N. ; Shingu, K. ; Masumoto, K.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.875-888, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

8. External control of guided resonance in photonic crystal slab by changing the index anisotropy of liquid crystal [6352-30]

Inoue, N. ; Baba, T.

Pub. info.:	Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63520R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6352

Conference Proceedings

9. Self-sealing materials for space debris shield

Tochizawa, M. ; Inoue, N. ; Tanaka, M. ; Nishi, Y.

Pub. info.:	Smart materials III : 13-15 December 2004, Sydney, Australia. pp.318-324, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5648

10.

Conference Proceedings

10. X-ray radiation of clusters irradiated by ultrafast high-intensity laser pulses

Fukuda, Y. ; Akahane, Y. ; Aoyama, M. ; Inoue, N. ; Ueda, H. ; Kishimoto, Y. ; Yamakawa, K. ; Faenov, A. Ya. ; Magunov, A. I. ; Pikuz, T. A. ; Skobelev, I. Y. ; Abdallah, J. Jr. ; Csanak, G. ; Boldarev, A. S. ; Gasilov, V. A.

Pub. info.:	Laser-generated and other laboratory X-ray and EUV sources, optics, and applications : 4-6 August 2003, San Diego, California, USA. pp.234-243, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5196

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