Yamada, K. ; Morisita, S. ; Kutsuna, M. ; Ikeda, T.
Pub. info.:
First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan. pp.65-70, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nose, Y. ; Ikeda, T. ; Nakajima, H. ; Tanaka, K. ; Numakura, H.
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Defect properties and related phenomena in intermetallic alloys : symposium held December 3-5, 2002, Boston, Massachusetts, U.S.A.. pp.381-386, 2003. Warrendale, Pa.. Materials Research Society
Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002. pp.129-132, 2003. Amsterdam. Elsevier
Smart structures and materials 2003 : Modeling, signal processing, and control :3-6 March 2003, San Diego, California, USA, Ralph C. Smith, chairs/editors ; Sponsored by SPIE--The International Society for Optical Engineering. pp.35-45, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Uenishi, K. ; Seki, M. ; Kunimasa, T. ; Takatsugu, M. ; Kobayashi, K.F. ; Ikeda, T. ; Tsuboi, A.
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Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.57-62, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Richerzhagen, B. ; Kutsuna, M. ; Okada, H. ; Ikeda, T.
Pub. info.:
Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.91-94, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ikeda, T. ; Kotani, T. ; Sato, T. ; Ueno, K. ; Matsuoka, R.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.950-961, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering