1.

Conference Proceedings
Conference Proceedings
1. Reliability Characteristics of MOS Capacitors with CVD Ta205/N20-Grown SiO2 Stacked Gate Dielectrics
Sun, S.C. ; Huang, Y.L.
Pub. info.: Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues.  pp.209-213,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-8
2.

Conference Proceedings
Conference Proceedings
2. MIN-CYANIDE: AN EXPERT SYSTEM FOR CYANIDE WASTE MINIMIZATION IN ELECTROPLATING PLANTS
Huang, Y.L. ; Sundar, G. ; Fan, L.T.
Pub. info.: AIChE SPRING MEETING, HOUSTON, TEXAS APRIL 7-11, 1991.  1991.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1991
3.

Conference Proceedings
Conference Proceedings
3. FUZZY LOGIC AND EXPERT SYSTEM BASE DECISION SUPPORT FOR WASTE MINIMIZATION IN ELECTROPLATING PLANTS
Luo, K.Q. ; Huang, Y.L.
Pub. info.: AIChE 1995 SPRING MEETING -HOUSTON, TX- MARCH 19-23, 1995.  1995.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1995