1.

Conference Proceedings
Conference Proceedings
1. Characterization of 4H-SiC-SiO2 Interfaces by a Deep Ultraviolet Spectroscopic Ellipsometer
H. Seki ; T. Wakabayashi ; Y. Hijikata ; H. Yaguchi ; S. Yoshida
Pub. info.: Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain.  pp.505-508,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 615-617
2.

Conference Proceedings
Conference Proceedings
2. Development of an Engineering Knowledge Management System for Nuclear Power Plants
H. Seki ; T. Kasahara ; Y. Oota
Pub. info.: Plant Operations and maintenance, major component reliability and materials issues : presented at 8th International Conference on Nuclear Engineering, Baltimore, Maryland, April 2-6, 2000.  1  pp.269-274,  2000.  New York.  American Society of Mechanical Engineers
Title of ser.: ASME Symposia Volumes
Ser. no.: ICONE 8(1)
3.

Conference Proceedings
Conference Proceedings
3. Fatigue Strength of Lotus-Type Porous Magnesium
H. Seki ; M. Tane ; H. Nakajima
Pub. info.: PRICM 6 : selected, peer reviewed papers from The sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea.  561-565  pp.1681-1684,  2007.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 561-565
4.

Technical Paper
Technical Paper
4. Unsteady Measurement of a Transonic Delta Wing Flow by a Novel PSP
M. Kameda ; H. Seki ; T. Makoshi ; Y. Amao ; K. Nakakita
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Applied Aerodynamics Conference
Ser. no.: 2008
5.

Conference Proceedings
Conference Proceedings
5. A novel Bayer-like WRGB color filter array for CMOS image sensors
H. Honda ; Y. Iida ; G. Itoh ; Y. Egawa ; H. Seki
Pub. info.: Human vision and electronic imaging XII : 29 January-1 February 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6492