1.

Conference Proceedings
Conference Proceedings
1. Atomic-Scale Defects in Silicon Carbide for Quantum Sensing Applications
V. Dyakonov ; H. Kraus ; V.A. Soltamov ; F. Fuchs ; D. Simin
Pub. info.: Silicon Carbide and Related Materials 2014 : Selected peer reviewed papers from the European Conference on Silicon Carbide & Related Materials (ECSCRM 2014), September 21-25, 2014, Grenoble, France.  pp.355-358,  2015.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 821-823
2.

Conference Proceedings
Conference Proceedings
2. Creation and Functionalization of Defects in SiC by Proton Beam Writing
T. Ohshima ; T. Honda ; S. Onoda ; T. Makino ; M. Haruyama ; T. Kamiya ; T. Satoh ; Y. Hijikata ; W. Kada ; O. Hanaizumi ; A. Lohrmann ; J.R. Klein ; B.C. Johnson ; J.C. McCallum ; S. Castelletto ; B.C. Gibson ; H. Kraus ; V. Dyakonov ; G.V. Astakhov
Pub. info.: Silicon Carbide and Related Materials 2016.  pp.233-237,  2017.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 897