1.

Conference Proceedings
Conference Proceedings
1. The Effects of Radiation and Charge Trapping on Reliability of Alternative Gate Dielectrics
Felix, J. A. ; Shaneyfelt, M. R. ; Schwank, J. R. ; Dodd, P. E. ; Fleetwood, D. M. ; Zhou, X. J. ; Gusev, E. P.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.299-323,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Defect and Composition Analysis of as-deposited and Nitrided (100)Si/SiO2/Hf1-xSiO2 Stacks byElectron Paramagnectic Resonance and Ion Beam Analysis
von Bardeleben, H. J. ; Cantin, J. L. ; Ganem, J. J. ; Trimaille, I. ; Gusev, E. P.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.249-263,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
3.

Conference Proceedings
Conference Proceedings
3. Ultrathin oxide films for advanced gate dielectrics applications. Current progress and future challenges
Gusev, E. P.
Pub. info.: Defects in SiO[2] and related dielectrics : science and technology.  pp.557-580,  2000.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 2