1.

Conference Proceedings
Conference Proceedings
1. THE EXTRACTION OF MINORITY CARRIER LIFETIME FROM THE CURRENT-VOLTAGE CHARACTERISTICS OF Si/Si1-xGex DEVICES
Ghani, T. ; Hoyt, J.L. ; Noble, D.B. ; Gibbons, J.F. ; Turner, J.E. ; Kamins, T.I.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.385-390,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Chemical Vapor Deposition of Column IV Heterostructures: Growth and Device Applications
Hoyt, J.L. ; Mitchell, T.O. ; Rim, K. ; Singh, D. ; Gibbons, J.F.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.1254-1265,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
3.

Conference Proceedings
Conference Proceedings
3. THE EFFECT OF OXYGEN ON THE THERMAL STABILITY OF Si1-x Gex STRAINED LAYERS GROWN BY LIMITED REACTION PROCESSING
Nobel, D.B. ; Hoyt, J.L. ; Kuo, P. ; Nix, W.D. ; Gibbons, J.F. ; Laderman, S.S. ; Turner, J.E. ; Rosner, S.J. ; Scott, M.P.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.247-252,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220