1.

Conference Proceedings
Conference Proceedings
1. Characterization and modeling of Defects in High-k Layers Through Fast Electrical Transient Measurements
Mitard, J. ; Leroux, C. ; Reimbold, G. ; Garros, X. ; Martin, F. ; Ghibaudo, G.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.73-85,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Modeling and Electrical Characterization of MOS Structures with Ultra-Thin Gate Oxide
Clerc, R. ; Ghibaudo, G.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.551-572,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
3.

Conference Proceedings
Conference Proceedings
3. Impact of quantum-mechanical effects on the double-gate MOSFET characteristics
Dauge, F. ; Jomaah, J. ; Ghibaudo, G.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.383-388,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
4.

Conference Proceedings
Conference Proceedings
4. Evaluation and Comparison of Various Silicon-On-Sapphire (SOS) Materials using the Pseudo-MOSFET Technique
Hefyene, N. ; Cristoloveanu, S. ; Ghibaudo, G. ; Matsui, M. ; Yasujima, A.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.133-138,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
5.

Conference Proceedings
Conference Proceedings
5. Characterization and modeling of low-frequency noise in sub-0.1 -pm SiGe pMOSFETs
Romanjek, K. ; Chroboczek, J. A. ; Ghibaudo, G. ; Ernst, T.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.496-506,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
6.

Conference Proceedings
Conference Proceedings
6. Direct extraction of McWhorter's constant from LFN spectra of MOSFETs with planar layers of Si nanocrystals embedded in gate SiO2
Ferraton, S. ; Zimmermann, J. ; Montres, L. ; Ghibaudo, G. ; Brini, J. ; Gurgul, J. ; Chroboczek, J. A.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.560-565,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
7.

Conference Proceedings
Conference Proceedings
7. *Challenges in interface trap characterization of deep sub-micron MOS devices using charge pumping techniques
Autran, J. L. ; Masson, P. ; Ghibaudo, G.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.275-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
8.

Conference Proceedings
Conference Proceedings
8. Low-frequency noise and fluctuations in advanced CMOS devices (Invited Paper)
Ghibaudo, G.
Pub. info.: Noise in Devices and Circuits.  pp.16-28,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113