1.

Conference Proceedings
Conference Proceedings
1. Characterization of Stress Relaxation, Dislocations and Crystallographic Tilt Via X-ray Microdiffraction in GaN (0001) Layers Grown by Maskless Pendeo-Epitaxy
Barabash, R. I. ; Ice, G. E. ; Liu, W. ; Einfeldt, S. ; Hommel, D. ; Roskowski, A. M. ; Davis, R. F.
Pub. info.: Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.115-120,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 875
2.

Conference Proceedings
Conference Proceedings
2. Micro-Photoluminescence studies of excitonic and multiexcitonic states of quantum dot-like localization centers in InGaN/GaN structures
Sebald, K. ; Lohmeyer, H. ; Gutowski, J. ; Einfeldt, S. ; Roder, C. ; Hommel, D.
Pub. info.: GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A..  pp.299-304,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 831