1.

Conference Proceedings
Conference Proceedings
1. CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEFECTS IN BETA SILICON CARBIDE THIN FILMS
Carter Jr., C. H. ; Edmond, J. A. ; Palmour, J. W. ; Ryu, J. ; Kim, H. J. ; Davis, R. F.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.593-598,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
2.

Conference Proceedings
Conference Proceedings
2. *GROWTH, DOPING, DEVICE DEVELOPMENT AND CHARACTERIZSATION OF CVD BETA-SiC EPILAYERS ON Si (100) AND ALPHA-SiC (0001)
Kong, H. ; Kim, H,. J. ; Edmond, J. A. ; Palmour, J.. W. ; Ryu, J. ; Carter Jr., C. H. ; Glass, J. T. ; Davis, R. F.
Pub. info.: Novel refractory semiconductors : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.233-246,  1987.  Pittsburgh, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 97