Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

29 results

Conference Proceedings

1. CHARACTERIZATION OF GROWTH DEFECTS IN ZnTe SINGLE CRYSTALS

Zhou, W. ; Wu, J. ; Dudley, M. ; Su, C.H. ; Volz, M.P. ; Gillies, D.C. ; Szofran, F.R. ; Lehoczky, S.L.

Pub. info.:	Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A.. pp.203-208, 1994. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	299

Conference Proceedings

2. X-RAY TOPOGRAPHIC ANALYSIS OF STRAIN FIELDS ASSOCIATED WITH MICRON-SIZED GRATINGS ON Si(100) SURFACES

Jardine, A.P. ; Dudley, M. ; Tolis, G. ; Yao, G.-D. ; Durbin, S.M.

Pub. info.:	Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.533-538, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	160

Conference Proceedings

3. DETERMINATION OF 3-DIMENSION DEFECT STRUCTURES IN GALLIUM ARSENIDE EPILAYERS ON SILICON USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN BOTH TRANSMISSION AND GRAZING BRAGG-LAUE GEOMETRY

Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.Y. ; Kao, Y.C.

Pub. info.:	Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.469-474, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	160

Conference Proceedings

4. THE APPLICATION OF NEUTRON TOPOGRAPHY TO THE STUDY OF X-RAY SENSITIVE ORGANIC CRYSTALS - A POSSIBLE ALTERNATIVE TO X-RAY TOPOGRAPHY

Dudley, M.

Pub. info.:	Neutron scattering for materials science : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A.. pp.55-60, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	166

Conference Proceedings

5. OPTIMIZATION OF MBE OF CdTe/CdTe: REFINEMENT IN STRUCTURAL QUALITY EVALUATION OF MBE GROWN (111) CdTe

Lee, M. B. ; Fanning, T. ; Marzio, Di D. ; Casagrande, L. G. ; Dudley, M.

Pub. info.:	Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.169-174, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	262

Conference Proceedings

6. Studies of Interface Demarcation and Structural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography

Chung, H. ; Raghothamachar, B. ; Zhou, W. ; Dudley, M. ; Gillies, D. C.

Pub. info.:	Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.107-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	437

Conference Proceedings

7. Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-ray Topography

Si, W. ; Dudley, M. ; Carter, C. ; Glass, R. ; Tsvetkov, V.

Pub. info.:	Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.129-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	437

Conference Proceedings

8. Dynamic In Situ Synchrotron X-ray Topographic Observations of Dislocations in Notched Ice Crystals

Hu, X. ; Baker, I. ; Dudley, M.

Pub. info.:	Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.119-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	437

Conference Proceedings

9. USE OF SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY TO CHARACTERIZE IR DETECTOR MANUFACTURING PROCESSES

Dudley, M. ; Wu, Jun ; Larson, D. J., Jr. ; DiMarzio, D.

Pub. info.:	Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.. pp.457-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	324

10.

Conference Proceedings

10. Nonmicropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications

Neudeck, P. G. ; Huang, W. ; Dudley, M. ; Fazi, C.

Pub. info.:	Wide-bandgap semiconductors for high power, high frequency, and high temperature : symposium held April 13-15, 1998, San Francisco, California, U.S.A.. pp.107-, 1998. Warrendale, Penn.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	512

29 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by: