Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Du, J. ; Chen, M. ; Ma, Y. ; Zhu, J. ; Peng, Q. ; Guo, Y. ; Du, C.
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Current developments in lens design and optical engineering VI : 2-4 August 2005, San Diego, California, USA. pp.58740S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sunar, U. ; Quon, H. ; Zhang, J. ; Du, J. ; Durduran, T. ; Zhou, C. ; Yu, G. ; Kilger, A. ; Lustig, R. ; Loevner, L. ; Nioka, S. ; Yodh, A. G. ; Chance, B.
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Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.114-123, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Health monitoring and smart nondestructive evaluation of structural and biological systems IV : 7-9 March 2005, San Diego, California, USA. pp.11-18, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering