Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Chen, M. ; Zhu, J. ; Ma, Y. ; Du, J. ; Guo, Y. ; Du, C.
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ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.60320K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Du, J. ; Chen, M. ; Ma, Y. ; Zhu, J. ; Peng, Q. ; Guo, Y. ; Du, C.
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Current developments in lens design and optical engineering VI : 2-4 August 2005, San Diego, California, USA. pp.58740S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sunar, U. ; Quon, H. ; Zhang, J. ; Du, J. ; Durduran, T. ; Zhou, C. ; Yu, G. ; Kilger, A. ; Lustig, R. ; Loevner, L. ; Nioka, S. ; Yodh, A. G. ; Chance, B.
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Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Peng, Q. ; Guo, Y. ; Chen, B. ; Du, J. ; Xiang, J. ; Cui, Z.
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Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France. pp.748-754, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.114-123, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gao, F. ; Tang, X. ; Wen, S. ; Du, J. ; Guo, Y. ; Yao, J.
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Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.568-575, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Tang, X. ; Gao, F. ; Zhang, Y. ; Du, J. ; Guo, Y. ; Du, C.
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Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.519-527, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Du, J. ; Li, Z. ; Wang, Y. ; Da, Z. ; Long, J. ; He, M.
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Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004. pp.2309-2315, 2004. Amsterdam. Elsevier
Health monitoring and smart nondestructive evaluation of structural and biological systems IV : 7-9 March 2005, San Diego, California, USA. pp.11-18, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mechanisms of surface and microstructure evolution in deposited films and film structures : symposium held April 17-20, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Zhang, Y. ; Du, J. ; Yang, J. ; Zeng, Y. ; Guo, Y. ; Cui, Z. ; Yao, J.
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Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France. pp.755-759, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61500K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Qiu, M. ; Lue, M. ; Wang, K. ; Qiu, A. ; Zeng, Z. ; Hei, D. ; Du, J. ; Kuai, B. ; Yuan, Y. ; Tian, H. ; Luo, J.
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25th International Congress on High-Speed Photography and Photonics. pp.505-509, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang, Y. ; Zhang, R. ; Xing, H. ; Li, C. ; Zhou, J. ; Cheng, H. ; Chen, L. ; Jin, X. ; Du, J.
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Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002. pp.482-488, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Health Monitoring of Aerospace Materials and Composites II. pp.105-114, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Xiong, W. ; Guo, X. ; Du, J. ; Hou, X. ; Du, C. ; Yao, J.
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Plasmonics: Nanoimaging, Nanofabrication, and their Applications II. pp.632410-632410, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Micromachining Technology for Micro-Optics and Nano-Optics. pp.111-117, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jayaraman, S.B. ; Dick, J.P. ; Craychee, T. ; Du, J. ; Tittmann, B.R.
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Smart Nondestructive Evaluation for Health Monitoring of Structural and Biological Systems. pp.397-403, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering