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15 results

Conference Proceedings

1. Measurement of lens aberration by using in-situ interferometer and classification of lens for correct application

Seong,N. ; Yeo,G. ; Cho,H. ; Moon,J.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.30-39, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

2. Interfield sampling method dependency of overlay and global alignment

Hong,J. ; Lee,J. ; Cho,H. ; Moon,J. ; Lee,S.

Pub. info.:	Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.856-862, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3998

Conference Proceedings

3. Patterning 220-nm pitch DRAM patterns by using double mask exposure

Nam,D. ; Seong,N. ; Cho,H. ; Moon,J. ; Lee,S.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.283-292, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

4. Pattern asymmetry correction using assist patterns

Ryoo,M. ; Nam,D. ; Cho,H. ; Moon,J. ; Lee,S.

Pub. info.:	Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA. Part1 pp.307-314, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4000

Conference Proceedings

5. Measurement of 6-DOF displacement of rigid bodies through splitting a laser beam: experimental investigation

Park,W.S. ; Cho,H. ; Byun,Y.K. ; Park,N.Y.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.80-91, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

6. Enhancement of placement accuracy for SMD via development of a new illumination system

Ko,K.W. ; Kim,J.W. ; Cho,H. ; Jin,K.S. ; Koh,K.I.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.51-61, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

7. Sensor-based navigation of air duct inspection mobile robots

Koh,K.C. ; Choi,H.J. ; Kim,J.S. ; Ko,K.W. ; Cho,H.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.202-211, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

8. Three-dimensional volume reconstruction of an object from x-ray images

Roh,Y.J. ; Kim,B.M. ; Cho,H. ; Kim,H.C.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.181-191, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

9. Adaptive tracking of weld joints using active contour model in arc-welding processes

Kim,J.S. ; Koh,K.C. ; Cho,H.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.29-40, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

10.

Technical Paper

10. Effects of Rib Turbulator on Heat/Mass Transfer for Impingement/Effusion Cooling with Crossflow

Rhee, D. ; Nam, Y. ; Cho,H.

Pub. info.:	AIAA meeting papers on disc. 2004. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:	42nd

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