1.

Conference Proceedings
Conference Proceedings
1. Novel device structure for low-temperature polysilicon TFTs with controlled grain growth in channel regions
Cheng,L.-J. ; Lu,Y.-L. ; Lin,C.-W. ; Chang,T.-K. ; Cheng,H.-C.
Pub. info.: Display technologies III : 26-27 July 2000, Taipei, Taiwan.  pp.51-54,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4079
2.

Conference Proceedings
Conference Proceedings
2. Field emission characteristics of carbon nanotube emitters using screen-printing technique
Lee,C.-C. ; Chuang,F.-Y. ; Lin,J.-D. ; Liao,J.-H. ; Cheng,H.-C. ; Sheu,J.-R. ; Chang,Y.-Y. ; Tsou,C.-C. ; Wang,W.-C.
Pub. info.: Display technologies III : 26-27 July 2000, Taipei, Taiwan.  pp.101-109,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4079
3.

Conference Proceedings
Conference Proceedings
3. Field emission display using carbon nanotubes as emitters
Chuang,F.-Y. ; Lee,C.-C. ; Lin,J.-D. ; Liao,J.-H. ; Cheng,H.-C. ; Han,C.-X. ; Kwo,J.-L ; Wang,W.-C.
Pub. info.: Display technologies III : 26-27 July 2000, Taipei, Taiwan.  pp.94-100,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4079
4.

Conference Proceedings
Conference Proceedings
4. Process development and impurities analysis for the bottom antireflective coating material
Ko,F.-H. ; Chen,H.-L. ; Huang,T.-Y. ; Cheng,H.-C. ; Ko,C.-J. ; Chu,T.-C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XV.  pp.562-571,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344