1.

Conference Proceedings
Conference Proceedings
1. 49 Characteristics of Hf(Si,O) Gate Dielectrics as a Function of Hf Content
Chang, K. ; Shallenberger, J. ; Chang, F.-M. ; Shanmugasundaram, K. ; Roman, P. ; Mumbauer, P. ; Ruzyllo, J.
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium.  pp.404-410,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-05
2.

Technical Paper
Technical Paper
2. On the Calculation of Reynolds Stresses by CFD
Guo, Y. ; Chang, K.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Fluid Dynamics Conference
Ser. no.: 35th
3.

Technical Paper
Technical Paper
3. Turbulence Trailing Edge Noise at Low Mach Number
Koh, S. ; Chang, K. ; Moon, Y.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/CEAS Aeroacoustics Conference
Ser. no.: 11th
4.

Technical Paper
Technical Paper
4. Calculation of H2-He Flow with Nonequilibrium Ionization and Radiation
Furudate, M. ; Chang, K. ; Jeung, I.
Pub. info.: AIAA meeting papers on disc.  2005.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 43rd