Castaldini, A. ; Cavalcoli, D. ; Cavallini, A. ; Rossi, M.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.346-356, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Castaldini, A. ; Cavakoli, D. ; Cavallini, A. ; Rossi, M.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.346-356, 2003. Pennington, NJ. Electrochemical Society
Castaldini, A. ; Cavallini, A. ; Nava, F. ; Fuochi, P.G. ; Vanni, P.
Pub. info.:
Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden. pp.439-442, 2003. Zuerich, Switzerland. Trans Tech Publications
Scaltrito, L. ; Porro, S. ; Giorgis, F. ; Mandracci, P. ; Cocuzza, M. ; Pirri, C.F. ; Ricciardi, C. ; Ferrero, S. ; Richieri, G. ; Sgorlon, C. ; Merlin, L. ; Cavallini, A. ; Castaldini, A.
Pub. info.:
Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden. pp.455-458, 2003. Zuerich, Switzerland. Trans Tech Publications