1.

Conference Proceedings
Conference Proceedings
1. Characterization of Bulk and Interface Properties of Dielectric Layers and Stacks
Okorn-Schmidt, H.F. ; Gusev, E.P. ; Buchanan, D.A. ; Cartier, E. ; Guha, S. ; Bojarczuk, N.A. ; Rath, D.L. ; Callegari, A. ; Gribelyuk, M. ; Copel, M.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.505-512,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2
2.

Conference Proceedings
Conference Proceedings
2. Physical Characterization of Ultrathin Films of High Dielectric Constant Materials on Silicon
Gusev, E.P. ; Copel, M. ; Cartier, E. ; Buchanan, D. ; Okorn-Schmidt, H. ; Cribelyuk, M.A. ; Falcon, D. ; Murphy, R. ; Molis, S. ; Baumvol, I.J.R. ; Krug, C. ; Jussila, M. ; Tuominen, M. ; Haukka, S.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.477-486,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2