1.

Conference Proceedings

Conference Proceedings
Liu,H.C. ; Gao,M. ; Buchanan,M. ; Wasilewski,Z.R. ; Poole,P.
Pub. info.: Applications of photonic technology 3 : closing the gap between theory, development, and application.  pp.214-218,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3491
2.

Conference Proceedings

Conference Proceedings
Liu,H.C. ; Li,L. ; Allard,L.B. ; Buchanan,M. ; Wasilewski,Z.R. ; Brown,G.J. ; Szmulowicz,F. ; Hegde,S.M.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.167-172,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
3.

Conference Proceedings

Conference Proceedings
Ershov,M. ; Liu,H.C. ; Buchanan,M. ; Wasilewski,Z.R.
Pub. info.: Photodetectors : materials and devices II : 12-14 February 1997, San Jose, California.  pp.153-160,  1997.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2999
4.

Conference Proceedings

Conference Proceedings
Liu,H. ; Li,J. ; Wasilewski,Z.R. ; Buchanan,M.
Pub. info.: Quantum well and superlattice physics VI : 29-30 January 1996, San Jose, California.  pp.148-156,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2694
5.

Conference Proceedings

Conference Proceedings
Dupont,E. ; Liu,H.C. ; Buchanan,M. ; Wasilewski,Z.R. ; St-Germain,D. ; Chevrette,P.C.
Pub. info.: Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California.  pp.155-162,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3629