Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.:
Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.. pp.D10.3/G7.3-, 2001. Warrendale, PA. Materials Research Society
Walther, D. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Oh, M. ; Merchant, S. ; Naresh, P.
Pub. info.:
Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.. pp.D10.1/G7.1-, 2001. Warrendale, PA. Materials Research Society
Spolenak, R. ; Volkert, C.A. ; Ziegler, S. ; Panofen, C. ; Brown, W.L.
Pub. info.:
Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, PA. Materials Research Society
Walther, D. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Oh, M. ; Merchant, S. ; Naresh, P.
Pub. info.:
Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A.. pp.G7.1/D10.1-, 2001. Warrendale, PA. Materials Research Society
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.:
Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A.. pp.G7.3/D10.3-, 2001. Warrendale, PA. Materials Research Society
Valek, B.C. ; Tamura, N. ; Spolenak, R. ; MacDowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Bravman, J.C. ; Brown, W.L. ; Batterman, B. W. ; Patel, J. R.
Pub. info.:
Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, PA. Materials Research Society
Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.. pp.D8.8-, 2001. Warrendale, PA. Materials Research Society
Reliability, Testing, and Characterization of MEMS/MOEMS III. pp.154-162, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering