1.

Conference Proceedings
Conference Proceedings
1. Discovery of Long-Range Order in Thin (2-20 nm) SiO2 Films by Ion-Beam Analysis
Herbots, N. ; Atluri, V. ; Hurst, Q. B. ; Shaw, J. M. ; Banerjee, S. ; Bradley, J. D. ; Culbertson, R. J. ; Smith, D. J.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.137-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Conference Proceedings
Conference Proceedings
2. Long-Range Order in Ultrathin SiO2 Grown on Ordered Si(100)
Hurst, Q. B. ; Herbots, N. ; Shaw, J. M. ; Floyd, M. M. ; Smith, D. J. ; Culbertson, R. J. ; Grams, M. P. ; Bradley, J. D. ; Zimmerman, P. ; Atluri, V.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.181-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567