1.

Conference Proceedings
Conference Proceedings
1. CRYSTALLINITY OF ISOLATED SILICON EPITAXY (ISE) SILICON-ON-INSULATOR LAYERS
Allen, L. T. P. ; Zavrachy, P. M. ; Vu, D. P. ; Batty, M. W. ; Henderson, W. R. ; Boden T. J. ; Bowen, D. K. ; Gorden-Smith D. ; Thomas, C. R. ; Tjahjadi, T.
Pub. info.: Chemistry and defects in semiconductor heterostructures.  pp.409-414,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 148
2.

Conference Proceedings
Conference Proceedings
2. { 224 } PLANE X-RAY DIFFRACTION STUDY OF GaAs ON Si WAFER USING A CONVENTIONAL DOUBLE CRYSTAL DIFFRACTOMER
Lee, J. W. ; Bowen, D. K. ; Salerno, J. P.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.193-200,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91
3.

Conference Proceedings
Conference Proceedings
3. CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION
Bowen, D. K. ; Hill, M. J. ; Tanner, B. K.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.447-454,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82