1.

Conference Proceedings

Conference Proceedings
Beyer, W. ; Camargo, S. S. ; Saleh, R.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A23.4-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
2.

Conference Proceedings

Conference Proceedings
Beck, Tobias J. ; Beyer, W. ; Pongratz, T. ; Stummer, W. ; Waidelich, R.M. ; Stepp, H. ; Wagner, S. ; Baumgartner, R.
Pub. info.: Photon migration and diffuse-light imaging : 22-23 June 2003, Munich, Germany.  pp.96-105,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5138
3.

Conference Proceedings

Conference Proceedings
Beserman, R. ; Beyer, W. ; Chack, A. ; Edelman, F. ; Rech, B. ; Roschek, T. ; Weil, R. ; Werner, P.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A5.8-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
4.

Conference Proceedings

Conference Proceedings
Mahan, A.H. ; Xu, Y. ; Iwaniczko, E. ; Williamson, D.L. ; Beyer, W. ; Perkins, J.D. ; Vanecek, M. ; Gedvilas, L.M. ; Nelson, B.P.
Pub. info.: Amorphous and heterogeneous silicon-based films - 2001 : symposium held April 16-20, 2001, San Francisco, California, U.S.A..  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 664
5.

Conference Proceedings

Conference Proceedings
Beyer, W. ; Zastrow, U.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A20.4-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
6.

Conference Proceedings

Conference Proceedings
Beyer, W. ; Dasgupta, A. ; Finger, F. ; Lambertz, A. ; Ray, S. ; Vetterl, O. ; Zastrow, U.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A13.5-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
7.

Conference Proceedings

Conference Proceedings
Edelman, F. ; Borner, F. ; Krause-Rehrberg, R. ; Werner, P. ; Weil, R. ; Beyer, W. ; Botz, R.
Pub. info.: Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.187-,  2000.  Pittsburgh, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 581
8.

Conference Proceedings

Conference Proceedings
Stepp, H. ; Beck, T. ; Beyer, W. ; Pfaller, C. ; Sroka, R. ; Baumgartner, R.
Pub. info.: Optical Methods for Tumor Treatment and Detection: Mechanisms and Techniques in Photodynamic Therapy XV.  pp.61390S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6139
9.

Conference Proceedings

Conference Proceedings
Baumgartner, R. ; Waidelich, R. ; Beyer, W. ; Stepp, H. G. ; Knuchel-Clarke, R. ; Hofstetter, A. G.
Pub. info.: Photonic Therapeutics and Diagnostics.  pp.207-213,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5686
10.

Conference Proceedings

Conference Proceedings
Stepp, H. G. ; Beck, T. ; Beyer, W. ; Pongratz, T. ; Sroka, R. ; Baumgartner, R. ; Stummer, W. ; Olzowy, B. ; Mehrkens, J. H. ; Tonn, J. Ch. ; Reulen, H. J.
Pub. info.: Photonic Therapeutics and Diagnostics.  pp.547-557,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5686