1.

Conference Proceedings
Conference Proceedings
1. Degradation in SiC Bipolar Devices: Sources and Consequences of Electrically Active Dislocations in SiC
Lendenmann, H. ; Bergman, J.P. ; Dahlquist, F. ; Hallin, C.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.901-906,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
2.

Conference Proceedings
Conference Proceedings
2. Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes
Jacobson, H. ; Bergman, J.P. ; Hallin, C. ; Tuomi, T. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.913-916,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
3.

Conference Proceedings
Conference Proceedings
3. Photoluminescence Up-Conversion Processes in SiC
Wagner, Mt. ; Ivanov, I.G. ; Storasta, L. ; Bergman, J.P. ; Magnusson, B. ; Chen, W.M. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.309-312,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
4.

Conference Proceedings
Conference Proceedings
4. Dll PL Intensity Dependence on Dose, Implantation Temperature and Implanted Species in 4H- and 6H-SiC
Carlsson, F.H.C. ; Sridhara, S.G. ; Hallen, A. ; Bergman, J.P. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.345-348,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
5.

Conference Proceedings
Conference Proceedings
5. Correlation between Electrical and Optical Mapping of Boron Related Complexes in 4H-SiC
Storasta, L. ; Magnusson, B. ; Henry, A. ; Linnarsson, M.K. ; Bergman, J.P. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.423-426,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
6.

Conference Proceedings
Conference Proceedings
6. Time-Resolved Photoluminescence of Deep Centers in Semi-Insulating 4H-SiC
Magnusson, B. ; Bergman, J.P. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.301-304,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
7.

Conference Proceedings
Conference Proceedings
7. Growth of High Quality p-Type 4H-SiC Substrates by HTCVD
Sundqvist, B. ; Ellison, A. ; Jonsson, A. ; Henry, A. ; Hallin, C. ; Bergman, J.P. ; Magnusson, B. ; Janzen, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.21-24,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
8.

Conference Proceedings
Conference Proceedings
8. Optical properties of InGaN/GaN and AlGaN/GaN multiple quantum well structures
Monemar, B. ; Paskov, P.P. ; Haratizadeh, H. ; Pozina, G.R. ; Bergman, J.P. ; Kamiyama, S. ; Iwaya, M. ; Amano, H. ; Akasaki, I.
Pub. info.: 10th International Symposium on Nanostructures: Physics and Technology.  pp.63-67,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5023