1.

Conference Proceedings
Conference Proceedings
1. Optical investigation of Ge-rich Ge1-xSix(o｡蛉｡？.1)alloys
Franz,M. ; Pressel,K. ; Dombrowski,K.F. ; Rucker,H. ; Barz,A. ; Dold,P. ; Benz,K.W.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.109-114,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. The Titanium and Vanadium Donor in CdTe
Christmann,P. ; Kreissl,J. ; Hoffmann,D.M. ; Meyer,B.K. ; Schwarz,R. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.779-783,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Melt Growth of Semiconductor Crystals in Microgravity Conditions
Benz,K.W. ; Croll,A.
Pub. info.: Theoretical and technological aspects of crystal growth : proceedings of the 10th International Summer School on Crystal Growth, ISSCG-10, Rimini, Italy, June 1998.  pp.109-118,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 276-277
4.

Conference Proceedings
Conference Proceedings
4. Self-cleaning effect and compensation mechanisms in CI-doped high-resistivity cadmium telluride
Babentsov,V.N. ; Corregidor,V. ; Benz,K.W. ; Feltgen,T. ; Fiederle,M. ; Dieguez,E.
Pub. info.: Materials and electronics for high-speed and infrared detectors : 19-20 and 23 July 1999, Denver, Colorado.  pp.88-95,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3794
5.

Conference Proceedings
Conference Proceedings
5. Direct Experimental Evidence of Autolocalization Nature of DX-Centers
Ganichev,S.D. ; Yassievich,I.N. ; Prettl,W. ; Diener,J. ; Meyer,B.K. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1079-1084,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings
Conference Proceedings
6. Vapor crystal growth of CdTe under terrestrial and microgravity conditions (Invited Paper)
Benz,K.W. ; Laasch,M. ; Kunz,T. ; Fiederle,M. ; Joerger,W.
Pub. info.: Materials research in low gravity : 28-29 July 1997, San Diego, California.  pp.2-6,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3123