1.

Conference Proceedings
Conference Proceedings
1. AlxGal-xN-Based UV Photodetectors and Waveguides
Omnes, F. ; Monroy, E. ; Beaumont, B. ; Dogheche, E.-H. ; Calle, F. ; Munoz, E. ; Gibart, P.
Pub. info.: Compound semiconductor power transistors II : proceedings of the second international symposium and state-of-the-art program on compound semiconductors (SOTAPOCS XXXII) : proceedings of the thirty-second international symposium.  pp.205-219,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-1
2.

Conference Proceedings
Conference Proceedings
2. Metal/GaN contacts studied by electron spectroscopies
Dumont, J. ; Caudano, R. ; Sporken, R. ; Monroy, E. ; Munoz, E. ; Beaumont, B. ; Gibert, P.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.79.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
3.

Conference Proceedings
Conference Proceedings
3. Defects Created by 25 keV Hydrogen Implantation in n-Type GaN
Auret, F.D. ; Meyer, W.E. ; Laarhoven, H.A. van ; Goodman, S.A. ; Legodi, M.J. ; Beaumont, B. ; Gibart, P.
Pub. info.: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.271-276,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 693
4.

Conference Proceedings
Conference Proceedings
4. Raman Mapping and Finite Element Analysis of Epitaxial Lateral Overgrown GaN on Sapphire Substrates
Benyoucef, M. ; Kuball, M. ; Beaumont, B. ; Bousquet, V. ; Gibart, P.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.109-114,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743
5.

Conference Proceedings
Conference Proceedings
5. Science data processing for the Advanced Microwave Scanning Radiometer-Earth observing system
Goodman, H.M. ; Regner, K. ; Conover, H. ; Ashcroft, P. ; Wentz, F. ; Conway, D. ; Lobl, E. ; Beaumont, B. ; Hawkins, L. ; Jones, S.
Pub. info.: Atmospheric and environmental remote sensing data processing and utilization : an end-to-end system perspective : 4-6 August 2004, Denver, Colorado, USA.  pp.195-206,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5548
6.

Conference Proceedings
Conference Proceedings
6. High Quality GaN on Si(111) Using (AIN/GaN)x Superlattice and Maskless ELO
Lahreche, H. ; Bousquet, V. ; Laugt, M. ; Tottereau, O. ; Vennegues, P. ; Beaumont, B. ; Gibart, P.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1487-1490,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
7.

Conference Proceedings
Conference Proceedings
7. A TEM study of GaN grown by ELO on (0001) 6H-Sic
Ruterana, P. ; Beaumont, B. ; Gibart, P. ; Melnik, Y.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W2.5.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
8.

Conference Proceedings
Conference Proceedings
8. From Relaxed to Highly Tensily Strained GaN Grown on 6H-SiC and Si(111): Optical Characterization
Leroux, M. ; Lahreche, H. ; Semond, F. ; Lauegt, M. ; Feltin, E. ; Schnell, N. ; Beaumont, B. ; Gibart, P. ; Massies, J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.795-798,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356