1.

Conference Proceedings
Conference Proceedings
1. Hot-carrier-induced degradation and lifetime prediction in off-state operation of deep submicron SOI n-MOSFETs
Renn, S.H. ; Pelloie, J.L. ; Balestra, F.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.283-288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. Impact of the Floating Body Induced Parasitic Bipolar Transistor on Hot-Carrier Effects in 0.1 μm N-Channel SOI MOSFETs
Renn, S.H. ; Pauly, E. ; Pelloie, J.L. ; Balestra, F.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.199-206,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
3.

Conference Proceedings
Conference Proceedings
3. Influence of the Substrate Bias on the Transconductance of Deep Submicron NMOSFETs
Szelag, B. ; Pangon, N. ; Balestra, F.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.140-146,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
4.

Conference Proceedings
Conference Proceedings
4. Comparison Between the Cryogenic Behaviour of Deep Submicron Bulk Si and SOI CMOS Devices
Balestra, F. ; Ghibaudo, G.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.171-186,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
5.

Conference Proceedings
Conference Proceedings
5. Short channel effects in sub 0.1 μm SOI-MOSFETs
Rauly, E. ; Balestra, F.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.227-232,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
6.

Conference Proceedings
Conference Proceedings
6. Analysis and modeling of self-heating effects in thin-film SOI MOSFET's as a function of temperature
Jomaah, J. ; Balestra, F. ; Ghibaudo, G.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.296-303,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
7.

Conference Proceedings
Conference Proceedings
7. The Cyogenic Operation of Deep Submicron MOSFETs
Balestra, F.
Pub. info.: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.235-250,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-9
8.

Conference Proceedings
Conference Proceedings
8. Temperature Dependence of Gate-Induced-Drain-Leakage (GIDL) Current in Thin-Film SOl MOSFETs
Jomaah, J. ; Ghibaudo, G. ; Balestra, F.
Pub. info.: Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.260-270,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-9