1.

Conference Proceedings
Conference Proceedings
1. Ion Yield, Sputter Rate, and SIMS Matrix Effects in Quantitative Analysis of (AlxGa1-x)0.5N0.5
Lefforge, D. L. ; Chang, Y. L. ; Ludowise, M. ; Allen, E. L.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.155-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Conference Proceedings
Conference Proceedings
2. Thermal Instability of the Ci-Ni Interface Above 200°C
Westmore, T. H. ; Baglin, J. E. E. ; Deline, V. R. ; Kellock, A. J. ; Parker, M. A. ; Beyers, R. ; Allen, E. L.
Pub. info.: High-density magnetic recording and integrated magneto-optics, materials and devices : symposium held April 12-16, 1998, San Francisco, California, U.S..  pp.13-,  1998.  Warrendale, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 517