1.

Conference Proceedings
Conference Proceedings
1. Vertical-scanning profilometry using double-exposure camera and two short-coherent light sources of different wavelengths
Adachi, M. ; Inabe, K.
Pub. info.: Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany.  pp.600-607,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4902
2.

Conference Proceedings
Conference Proceedings
2. Dynamic phase measurement of large deformation with speckle intererometry
Matsumoto, T. ; Kitagawa, Y. ; Adachi, M.
Pub. info.: Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany.  pp.571-575,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4902
3.

Conference Proceedings
Conference Proceedings
3. Deformation-phase measurement of difuse objects using two laser beams of different wavelengths
Tambara, Y. ; Adachi, M.
Pub. info.: Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany.  pp.608-615,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4902
4.

Conference Proceedings
Conference Proceedings
4. Formation of Metal Oxide Nanotubes through a Surfactant-Mediated Method in Laurylamine / Metal Alkoxide System
Adachi, M. ; Murata, Y. ; Harada, M.
Pub. info.: Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium.  pp.227-237,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-25
5.

Conference Proceedings
Conference Proceedings
5. On-Orbit Operations of NiMH Cells for Space Applications
Iwabuchi, T. ; Ishikawa, Y. ; Inafuku, H. ; Takahashi, K. ; Hirose, K. ; Tajima, M. ; Adachi, M. ; Kudoh, M.
Pub. info.: Proceedings of the Sixth European Space Power Conference (ESPC) : 6-10 May 2002, Porto, Portugal.  pp.635-640,  2002.  Noordwijk.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 502
6.

Conference Proceedings
Conference Proceedings
6. Formation Conditions of Integrated Ordered Microstructure of Nano-size Silica Materials in Laurylamine/Tetraethoxysilane System
Adachi, M. ; Taniguchi, H. ; Harada, M.
Pub. info.: Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan.  pp.259-262,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 132
7.

Conference Proceedings
Conference Proceedings
7. Simultaneous measurement of nanometric longitudinal displacement and micrometric lateral displacement by using one line CCD camera [6374A-08]
Adachi, M. ; Nishide, Y.
Pub. info.: Optomechatronic Actuators, Manipulation, and Systems Control.  pp.637408-637408,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6374
8.

Conference Proceedings
Conference Proceedings
8. High-speed precision surface profilometry using large phase shifting
Adachi, M. ; Ueda, K.
Pub. info.: Optomechatronic Systems IV.  pp.322-331,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5264
9.

Conference Proceedings
Conference Proceedings
9. Vertical-scanning profilometry having nanometric height resolution and scanning speed more than 40 μm/s
Adachi, M.
Pub. info.: Optomechatronic Sensors, Actuators, and Control.  pp.73-82,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5602
10.

Conference Proceedings
Conference Proceedings
10. Vibration frequency measurement with speckle interferometry
Matsumoto, T. ; Kitagawa, Y. ; Kosaka, N. ; Kinoshita, Y. ; Shimada, M. ; Adachi, M.
Pub. info.: Optomechatronic Sensors, Actuators, and Control.  pp.91-98,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5602