1.

Conference Proceedings
Conference Proceedings
1. Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques
Rivera, A. ; Montilla, I. ; Alba Garcia, A. ; Escobar Galindo, R. ; Falub, C.V. ; van Veen, A. ; Schut, H. ; de Nijs, J.M.M. ; Balk, P.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.64-66,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
2.

Conference Proceedings
Conference Proceedings
2. ROLE OF SiO AT TCOIP INTERFACE ON THE ELECTRICAL PROPERTIES OF THE P/I JUNCTION
Carvalho, C. ; de Nijs, J.M.M. ; Martins R. ; Guimaraes, L.
Pub. info.: Amorphous silicon technology 1991 : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.487-492,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 219