Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA. pp.692-697, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California. pp.126-132, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.19-25, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth international conference on material science and material properties for infrared optoelectronics : 22-24 may 2000, Kiev, Ukraine. pp.23-31, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.246-251, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.77-84, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Physics of irradiation effects in metals : PM'91 : International Conference on Physics of Irradiation Effects in Metals, Siofok, Hungary, May 20-24, 1991. pp.229-234, 1992. Aedermannsdorf, Switzerland. Trans Tech Publications
Light-Emitting Diodes: Research, Manufacturing, and Applications V. pp.90-98, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering