1.

Conference Proceedings
Conference Proceedings
1. Donor doping of ZnSe:lattice location aud annealing behaviour of implanted boron
Itterrnann,B. ; Welker,G. ; Kroll,F. ; Mai,F. ; Marbach,K. ; Ackermann,H. ; Stockmann,H.-J. ; Oldckop,E. ; Zeitz,W.-D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1389-1395,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Determination of the lattice site of nitrogen after implantation into ZnSe
Marbach,K. ; Ittermann,B. ; Fullgrabe,M. ; Heemeier,M. ; Kroll,F. ; Mai,F. ; Meier,P. ; Peters,D. ; H.Thieｦﾂ ; Ackermann,H. ; Stocknann,H.-J. ; Zeitz,W.-D. ; Wenisch,H. ; Hommel,D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1395-1400,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. The Behaviour of 12B in CdTe Studied with β-NMR Techniques
Oldekop,E. ; Eyert,V. ; Niedermeyer,F. ; Wienecke,M. ; Zeitz,W.-D.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.267-270,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249