1.

Conference Proceedings
Conference Proceedings
1. Real Time Analysis of Magnetron-Sputtered Thin-Film CdTe by Multichannel Spectroscopic Effipsometry
Li, Jian ; Chen, Jie ; Zapien, J. A. ; Prodaza, N. J. ; Chen, Chi ; Drayton, J. ; Vasko, A. ; Gupta, A. ; Wang, S. L. ; Collins, R. W. ; Compaan, A. D.
Pub. info.: Thin-film compound semiconductor photovoltaics : symposium held March 29-April 1, 2005, San Francisco, California, U.S.A..  pp.9-14,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 865
2.

Conference Proceedings
Conference Proceedings
2. Extension of Multichannel Spectroscopic Ellipsometry Into the Ultraviolet for Real-Time Characterization of the Growth of Wide-Bandgap Materials From 1.5 to 6.5 eV
Zapien, J. A. ; Collins, R. W. ; Messier, R.
Pub. info.: In situ process diagnostics and modelling : symposium held April 6-7, 1999, San Francisco, California, U.S.A..  pp.71-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 569
3.

Conference Proceedings
Conference Proceedings
3. Real-Time Characterization of Non-Ideal Surfaces and Thin-Film Growth by Advanced Ellipsometric Spectroscopies
Collins, R. W. ; Rovira, P. I. ; Ferlauto, A. S. ; Koh, J. ; An, I. ; Zapien, J. A. ; Messier, R. ; Wronski, C. R.
Pub. info.: In situ process diagnostics and modelling : symposium held April 6-7, 1999, San Francisco, California, U.S.A..  pp.43-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 569