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Conference Proceedings

1. Nondestructive Measurement of Grain Size in Steel Plates by Using Magnetic Coercive Force

Yoshino,M. ; Tanabe,H. ; Sakamoto,T. ; Suzuki,N. ; Yaji,Y.

Pub. info.:	Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995. pp.45-54, 1996. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	210-213

Conference Proceedings

2. White illumination characteristics of ZnS-based phosphor materials excited by InGaN-based ultraviolet light-emitting diode

Murakami,K. ; Taguchi,T. ; Yoshino,M.

Pub. info.:	Display technologies III : 26-27 July 2000, Taipei, Taiwan. pp.112-119, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4079

Conference Proceedings

3. Next Generation On-Line Ultrasonic Testing System,Using Real-Time Chirp Pulse Compression Processing

Yoshino,M. ; Okuno,R. ; Nagamune,A. ; Nishifuji,K.

Pub. info.:	Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995. pp.791-798, 1996. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	210-213

Conference Proceedings

4. Ultranarrow-bandwidth 4-kHz ArF excimer laser for 193-nm lithography

Saito,T. ; Matsunaga,T. ; Mitsuhashi,K. ; Terashima,K. ; Ohta,T. ; Tada,A. ; Ishihara,T. ; Yoshino,M. ; Tsushima,H. ; Enami,T. ; Tomaru,H. ; Igarashi,T.

Pub. info.:	Optical Microlithography XIV. 4346 pp.1229-1237, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4346

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