1.

Conference Proceedings
Conference Proceedings
1. MC1:Optical pickup employing a hologram-Laser photodiode unit.
Kurata,Y. ; Yoshida,S.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  pp.34-36,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
2.

Conference Proceedings
Conference Proceedings
2. Application of slip-band visualization technique to tensile analysis of laser-welded aluminum alloy
Muchiar ; Yoshida,S. ; Widiastuti,R. ; Kusnowo,A. ; Takahashi,K. ; Sato,S.
Pub. info.: International Conference on Experimental Mechanics: Advances and Applications, 4-6 December, 1996, Singapore.  pp.212-216,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2921
3.

Conference Proceedings
Conference Proceedings
3. Atmospheric studies using the high-resolution fly's eye xenon flasher array
Wiencke,L.R. ; Bird,D.J. ; Chen,G.F. ; Clay,R.W. ; Dai,H.Y. ; Dawson,B.R. ; Huang,M.A. ; Jui,C.C.H. ; Kidd,M.J. ; Kieda,D.B. ; Ko,S. ; Larsen,C.G. ; Loh,E.C. ; Smith,J.D. ; Sommers,P. ; Tang,J.K.K. ; Thomas,S.B. ; Wilkinson,C.R. ; Yoshida,S.
Pub. info.: Ultraviolet atmospheric and space remote sensing : methods and instrumentation : 7-8 August 1996.  pp.241-251,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2831
4.

Conference Proceedings
Conference Proceedings
4. Highly efficient operation of diode laser transversely pumped high-power Nd:YAG rod laser
Takada,A. ; Akiyama,Y. ; Takase,T. ; Yoshida,S. ; Yuasa,H. ; Ono,A.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.216-223,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
5.

Conference Proceedings
Conference Proceedings
5. The Characterization of SiC Hot-Implanted with Ga+
Tanaka,Y. ; Kobayashi,N. ; Hasegawa,M. ; Yoshida,S. ; Ishida,Y. ; Nishijima,T. ; Hayashi,N.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.713-716,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
6.

Conference Proceedings
Conference Proceedings
6. Study of Thermal Annealing of Vacancies in Ion Implanted 3C-SiC by Positron Annihilation
Ohshima,T. ; Uedono,A. ; Itoh,H. ; Abe,K. ; Suzuki,R. ; Ohdaira,T. ; Aoki,Y. ; Yoshikawa,M. ; Mikado,T. ; Okumura,H. ; Yoshida,S. ; Tanigawa,S. ; Nashiyama,I.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.745-748,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
7.

Conference Proceedings
Conference Proceedings
7. CVD Growth Mechanism of 3C-SiC on Si Substrates
Ishida,Y. ; Takahashi,T. ; Okumura,H. ; Yoshida,S. ; Sekigawa,T.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.183-186,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
8.

Conference Proceedings
Conference Proceedings
8. Characterization of Defects in As-Grown and Electron-Irradiated 3C-SiC Epilayers by Using Slow Positron
Itoh,H. ; Yoshikawa,M. ; Nashiyama,I. ; Wei,L. ; Tanigawa,S. ; Misawa,S. ; Okumura,H. ; Yoshida,S.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.501-506,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
9.

Conference Proceedings
Conference Proceedings
9. Generation Mechanisms of Trapped Charges in Oxide Layers of 6H-SiC MOS Structures Irradiated with Gamma-Rays
Yoshikawa,M. ; Saitoh,K. ; Ohshima,T. ; Itoh,H. ; Nashiyama,I. ; Takahashi,Y. ; Ohnishi,K. ; Okumura,H. ; Yoshida,S.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1017-1020,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
10.

Conference Proceedings
Conference Proceedings
10. Surface Reconstruction and As Surfactant Effects on MBE-Grown GaN Epilayers
Okumura,H. ; Hamaguchi,H. ; Ohta,K. ; Feuillet,G. ; Balakrishnan,K. ; Ishida,Y. ; Chichibu,S. ; Nakanishi,H. ; Nagatomo,T. ; Yoshida,S.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1167-1172,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268