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19 results

Conference Proceedings

1. Average atmosphere temperature measurement by a frequency-shifted feedback laser

Kibayashi,N. ; Hara,T. ; Yoshida,M. ; Nakamura,K. ; Ito,H.

Pub. info.:	Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan. pp.322-329, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4150

Conference Proceedings

2. Imaging of a single DNA molecule by AFM:study of DNA conformation change in HMG-DNA complex

Muramatsu,H. ; Kim,J.-M. ; Otani,T. ; Homma,K. ; Yoshida,M. ; Tate,S. ; Saito,M. ; Tamiya,E.

Pub. info.:	Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California. pp.99-104, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3922

Conference Proceedings

3. Control system of the FOCAS instrument for the Subaru Telescope

Sasaki,T. ; Yoshida,M. ; Shimizu,Y. ; Kosugi,G. ; Kashikawa,N. ; Yadoumaru,Y ; Takata,T. ; Iye,M.

Pub. info.:	Telescope control systems II : 27-28 July 1997, San Diego, California. pp.267-274, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3112

Conference Proceedings

4. Prototype of distributed analysis software hierarchy for the Subaru Telescope

Mizumoto,Y. ; Chikada,Y. ; Kosugi,G. ; Yagi,M. ; Nishihara,E. ; Takata,T. ; Yoshida,M. ; Ishihara,Y. ; Yanaka,H. ; Morita,Y. ; Nakamoto,H.

Pub. info.:	Observatory operations to optimize scientific return : 20-21 March 1998, Kona, Hawaii. pp.173-183, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3349

Conference Proceedings

5. Data analysis environment(DASH2000)for the Subaru telescope

Mizumoto,Y. ; Yagi,M. ; Chikada,Y. ; Ogasawara,R. ; Kosugi,G. ; Takata,T. ; Yoshida,M. ; Ishihara,Y. ; Yanaka,H. ; Yamamoto,T. ; Morita,Y. ; Nakamoto,H.

Pub. info.:	Advanced telescope and instrumentation control software : 29 and 30 March 2000, Munich, Germany. pp.429-439, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4009

Conference Proceedings

6. Mining sequential patterns including time intervals

Yoshida,M. ; Iizuka,T. ; Shiohara,H. ; Ishiguro,M.

Pub. info.:	Data mining and knowledge discovery : theory, tools, and technology. pp.213-220, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4057

Conference Proceedings

7. Software structure and its performance on FOCAS instrument control,a MOS design,and an analyzing package

Yoshida,M. ; Shimizu,Y. ; Sasaki,T. ; Kosugi,G. ; Takata,T. ; Sekiguchi,K. ; Kashikawa,N. ; Aoki,K. ; Asai,R. ; Ohyama,Y. ; Kawabata,K. ; Inata,M. ; Saito,Y. ; Taguchi,H. ; Yadoumaru,Y. ; Ozawa,T. ; Iye,M.

Pub. info.:	Advanced telescope and instrumentation control software : 29 and 30 March 2000, Munich, Germany. pp.240-249, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4009

Conference Proceedings

8. Effects of Si3N4 Films on Diffusion of Boron and Extended Defects in Silicon during Post-Implantation Annealing

Zaitsu,Y. ; Osada,K. ; Shimizu,T. ; Matsumoto,S. ; Yoshida,M. ; Arai,E. ; Abe,T.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1891-1896, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

9. Anomalous Diffusion of Phosphorus in Silicon by Pair Diffusion Model and Decrease in Quasi Vacancy Formation Energy

Yoshida,M.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1595-1600, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

10.

Conference Proceedings

10. Precipitates in Antimony Implanted Silicon

Kikuchi,Y. ; Uesugi,F. ; Kase,M. ; Yoshida,M. ; Watanabe,K. ; Hashimoto,I.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1871-1874, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

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