1.
|
Conference Proceedings
|
Chung, W.-Y. ; Kim, T.-K. ; Yoon, J.-Y. ; Kim, H.-W. ; Park, Y.-K. ; Kong, J.-T.
Pub. info.: |
Advances in Resist Technology and Processing XXI. pp.975-982, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5376 |
|
2.
|
Conference Proceedings
|
Yoon, J.-Y. ; Hata, M. ; Hah, J.-H. ; Kim, H.-W. ; Woo, S.-G. ; Cho, H.-K. ; Han, W.-S.
Pub. info.: |
Advances in Resist Technology and Processing XXI. pp.196-204, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5376 |
|