1.

Conference Proceedings
Conference Proceedings
1. Visible photoluminescence from Ge+-ion-implanted SiSxNy annealed under hydrostatic pressure
Tyschenko,I.E. ; Zhuravlev,K.S. ; Vandyshev,E.N. ; Misiuk,A. ; Yankov,R.A. ; Rebohle,L. ; Skorupa,W.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.237-241,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. Theoretical and experimental studies of(AIN)1-x(SIC)x layer structures formed by N + and AI + coimplantation in 6H-SiC
Kulikov,D.V. ; Pezoldt,J. ; Rybin,P.V. ; Skorupa,W. ; Trushin,Yu.V. ; Yankov,R.A.
Pub. info.: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.254-257,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3687
3.

Conference Proceedings
Conference Proceedings
3. Computer simulation and RBS/C studies of high-dose N+ and Al- co-implantation in 6H-SiC
Kharlamov,V.S. ; Kulikov,D.V. ; Trushin,Yu.V. ; Tsigankov,D.N. ; Yankov,R.A. ; Voelskow,M. ; Skorupa,W. ; Pezoldt,J.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.260-263,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
4.

Conference Proceedings
Conference Proceedings
4. Influence of internal stress fields due to point defect clusters on interstitial diffusion in SiC under irradiation
Rybin,P.V. ; Kulikov,D.V. ; Trushin,Yu.V. ; Petzoldt,J. ; Yankov,R.A.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.301-307,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
5.

Conference Proceedings
Conference Proceedings
5. Ion Beam Synthesis:A Novel Method of Producing(SiC)1-x(AlN)x Layers
Yankov,R.A. ; Fukarek,W. ; Voelskow,M. ; Pezoldt,J. ; Skorupa,W.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.753-756,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
6.

Conference Proceedings
Conference Proceedings
6. Cross-Sectional Micro-Raman Spectroscopy:A Tool for Structural Investigations of Thin Polytypic SiC Layers
Werninghaus,T. ; Zahn,D.R.T. ; Yankov,R.A. ; Mucklich,A. ; Pezoldt,J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.661-664,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
7.

Conference Proceedings
Conference Proceedings
7. A Computational Model for the Formation of(SiC)1-x(AlN)x Structures by Hot,High-Dose N+ and Al+ Co-Implants in 6H-SiC
Truschin,Yu.V. ; Yankov,R.A. ; Kharlamov,V.S. ; Kulikov,D.V. ; Tsigankov,D.N. ; Kreissig,U. ; Voelskow,M. ; Pezoldt,J. ; Skorupa,W.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.757-760,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268