1.

Conference Proceedings
Conference Proceedings
1. Lessons learned from the optics and local plane alignment of a wide field of view RC telescope [5877-12]
Kim, E. D. ; Choi, Y.-W ; Kang, M.-S ; Kim, E.-E. ; Yang, H.-S. ; bin Ismail, A.M.A.
Pub. info.: Optomechanics 2005 : 3-4 August 2005, San Diego, California, USA.  pp.58770C-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5877
2.

Conference Proceedings
Conference Proceedings
2. Development of Cassegrain type 0.9-m collimator [5869-43]
Yang, H.-S. ; Kang, M.-S. ; Kim, S.-H. ; Lee, Y.-W. ; Lee, J.-H. ; Song, J.-B. ; Kim, S.-W. ; Lee, J.-U. ; Lee, I.-W.
Pub. info.: Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA.  pp.586913-586914,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5869
3.

Conference Proceedings
Conference Proceedings
3. Pre-flight performance characterization of RazakSAT medium-sized aperture camera (MAC) [5882-06]
Choi, Y.-W. ; Kim, E. D. ; Kang, M.-S. ; Jeong, S.-K. ; Yang, S. ; Kim, J. ; Kim, E.-E. ; Park, S.-D. ; Yang, H.-S. ; Afiq bin Ismail, A. M. ; Arshad, A. S.
Pub. info.: Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA.  pp.588205-588205,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5882
4.

Conference Proceedings
Conference Proceedings
4. Stabilization of Low Dielectric Constant SiOF Films by Post-Deposition Annealing
Kim, H.-H. ; Lee, S.-K. ; Kim, S.-O. ; Kim, Y.-H. ; Kim, H.J. ; Sohn, Y.-S. ; Yang, H.-S. ; Kim, C.-T. ; Kim, D.H.
Pub. info.: Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues.  pp.126-135,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-8
5.

Conference Proceedings
Conference Proceedings
5. Deposition and Characterization of SiOF Films for Multi-level IMD
Kim, H.-H. ; Lee, S.-K. ; Kim, S.-O. ; Kim, Y.-H. ; Kim, H.J. ; Sohn, Y.-S. ; Yang, H.-S. ; Kim, C.-T. ; Kim, D.-H.
Pub. info.: Proceedings of the Second International Symposium on Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues.  pp.148-156,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-8
6.

Conference Proceedings
Conference Proceedings
6. Modification of One Phonon Emission Rates Due to Finite Size Effects in Y 2O 3Eu 3+ Nanocrystals
Yang, H.-S. ; Meltzer, R.S. ; Dennis, W.M. ; Feofilov, S.P. ; Tissue, B.M.
Pub. info.: Proceedings of the Fifth International Symposium on Quantum Confinement : nanostructures.  pp.430-438,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-19
7.

Conference Proceedings
Conference Proceedings
7. Real-time measurement of the small aspheric surface [5869-46]
Yang, H.-S. ; Song, J.-B. ; Lee, Y.-W. ; Lee, H.-Y. ; Lee, J.-H. ; Lee, l.-W.
Pub. info.: Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA.  pp.586916-586916,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5869
8.

Conference Proceedings
Conference Proceedings
8. Implementation of Hartmann test for measuring 0.9-m aspheric mirror (Invited Paper)
Yang, H.-S. ; Lee, Y.-W. ; Lee, J.-H. ; Song, J.-B. ; Lee, H.-Y. ; Lee, I.-W.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.154-163,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638