Matsubara, K. ; Yamada, A. ; Ishizuka, S. ; Sakurai, K. ; Tampo, H. ; Kimura, Y. ; Nakamura, S. ; Yonemura, M. ; Nakanishi, H. ; Niki, S.
Pub. info.:
Thin-film compound semiconductor photovoltaics : symposium held March 29-April 1, 2005, San Francisco, California, U.S.A.. pp.393-398, 2005. Warrendale, Pa.. Materials Research Society
Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA. pp.59090N-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wada, T. ; Grossman, C. H. ; Yamada, S. ; Yamada, A. ; Garito, A. F. ; Sasabe, H.
Pub. info.:
Advanced organic solid state materials : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A.. pp.519-524, 1990. Pittsburgh, Pa.. Materials Research Society
Kong, S. H. ; Kashiwabara, H. ; Ohki, K. ; Itoh, K. ; Okuda, T. ; Niki, S. ; Sakurai, K. ; Yamada, A. ; Ishizuka, S. ; Terada, N.
Pub. info.:
Thin-film compound semiconductor photovoltaics : symposium held March 29-April 1, 2005, San Francisco, California, U.S.A.. pp.155-160, 2005. Warrendale, Pa.. Materials Research Society
Uetani, Y. ; Moriuma, H. ; Hirai, Y. ; Takata, Y. ; Yamada, A.
Pub. info.:
Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.503-509, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ichikawa, M. ; Konagai, M. ; Takeshita, J. ; Yamada, A.
Pub. info.:
Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A.. pp.531-536, 1999. Warrendale. Materials Research Society
Goto, T. ; Yamada, A. ; Ohkawa, M. ; Sekine, S. ; Sato, T.
Pub. info.:
Electronics and structures for MEMS II : 17-19 December 2001, Adelaide, Australia. pp.337-344, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Beye, A.C. ; Yamada, A. ; Shimizu, A. ; Shibata, H. ; Tanoue, H. ; Mayer, K.M. ; Sugiyama, H. ; Kamijoh, K. ; Oda, T. ; Arriga, O. ; Akiyama, I. ; Kutsuwada, N. ; Matsumori, T. ; Uekusa, S. ; Makita, Y.
Pub. info.:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.139-144, 1990. Pittsburgh, Pa.. Materials Research Society
Shibata, H. ; Makita, Y. ; Yamada, A. ; Ohnishi, N. ; Mori, M. ; Nakayama, Y. ; Beye, A.C. ; Mayer, K.M. ; Takahashi, T. ; Sugiyama, Y. ; Tacano, M. ; Ishituka, K. ; Matsumori, T.
Pub. info.:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.121-126, 1990. Pittsburgh, Pa.. Materials Research Society
Makita, Y. ; Yamada, A. ; Shibata, H. ; Asakura, H. ; Ohnishi, N. ; Beye, A.C. ; Mayer, K.M. ; Kutsuwada, N.
Pub. info.:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.115-120, 1990. Pittsburgh, Pa.. Materials Research Society