1.

Conference Proceedings
Conference Proceedings
1. Enhancement of Upconversion Luminescence from Er Doped Al2O3 Films by a Thin Metal Layer
T. Nakamura ; M. Fujii ; Y. Usui ; T. Aisaka ; S. Hayashi
Pub. info.: Physics and Chemistry of Luminescent Materials, including the 4th Symposium on Persistent Phosphors.  pp.87-93,  2009.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(31)
2.

Conference Proceedings
Conference Proceedings
2. Methanol Oxidation at Pt-Ru-C ternary Electrode Prepared by co-sputtering Technique
Y. Matsumoto ; K. Horii ; K. Nagai ; M. Umeda ; Y. Usui
Pub. info.: Fuel Cell Seminar 2007.  pp.215-220,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 12(1)
3.

Conference Proceedings
Conference Proceedings
3. Development of a novel EUV mask protection engineering tool and mask handling techniques
M. Amemiya ; K. Ota ; T. Kamono ; H. Kubo ; Y. Usui ; T. Takikawa ; T. Taguchi ; O. Suga
Pub. info.: Photomask and next-generation lithography mask technology XIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6607
4.

Conference Proceedings
Conference Proceedings
4. Development of EUV mask handling technology at MIRAI-Selete
K. Ota ; M. Amemiya ; T. Taguchi ; T. Kamono ; H. Kubo ; T. Takikawa ; Y. Usui ; O. Suga
Pub. info.: Emerging lithographic technologies XI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6517
5.

Conference Proceedings
Conference Proceedings
5. Particle-free mask handling techniques and a dual-pod carrier
M. Amemiya ; K. Ota ; T. Taguchi ; T. Kamono ; Y. Usui
Pub. info.: Emerging lithographic technologies XII.  2  pp.69213T-1-69213T-10,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6921