Search records | 東京工業大学附属図書館文献データベース

Sort order

4 results

Conference Proceedings

1. Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs

Wright,S.L. ; Millman,S. ; Kodate,M.

Pub. info.:	Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California. pp.200-211, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3636

Conference Proceedings

2. Color calibration of liquid crystal displays

Cazes,A. ; Braudaway,G.W. ; Christensen,J. ; Cordes,M. ; DeCain,D. ; Lien,A. ; Mintzer,F.C. ; Wright,S.L.

Pub. info.:	Flat panel display technology and display metrology : 27-29 January 1999, San Jose, California. pp.154-161, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3636

Conference Proceedings

3. Alloy Effects on Emission Rates for Deep Donors(DX Centers)in AlxGa1-xAS with very low AlAS Mole Fraction

Mooney,P.M. ; Theis,T.N. ; Wright,S.L.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1109-1114, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

4. The Deep Donor(DX Center)in GaAs:Deterlnination of the Entropy Term in the Activation Energy

Theis,T.N. ; Morgan,T.N. ; Parker,B.D. ; Wright,S.L.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1073-1078, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41