1.

Conference Proceedings
Conference Proceedings
1. REACTION KINETICS, STRESS AND MICROSTRUCTURE IN TITANIUM-COPPER-TITANIUM THIN FILMS
Hu, C.-K. ; Gupta, D. ; Wetzel, J.T. ; Ho, P.S.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.153-158,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
2.

Conference Proceedings
Conference Proceedings
2. DOPANT DIFFUSION IN TiSi2
d'Heurle, F.M. ; Michel, A.E. ; LeGoues, F.K. ; Scilla, G. ; Wetzel, J.T. ; Gas, P.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.333-338,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
3.

Conference Proceedings
Conference Proceedings
3. COMPUTED STRUCTURES OD [001] SYMMETRICAL TILT BOUNDERIES
Wetzel, J.T. ; Levi, A.A. ; Smith, D.A.
Pub. info.: Computer-based microscopic description of the structure and properties of materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.157-162,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 63
4.

Conference Proceedings
Conference Proceedings
4. A Three-Phase Model For The Structure Of Porous Thin Films Determined By X-ray Reflectivity And Small-Angle Neutron Scattering
Wu, W. ; Lin, E.K. ; Jin, C. ; Wetzel, J.T.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D5.22-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
5.

Conference Proceedings
Conference Proceedings
5. Structure And Property Characterization Of Porous Low-k Dielectric Constant Thin Films Using X-ray Reflectivity And Small Angle Neutron Scattering
Lin, E.K. ; Wu, W. ; Jin, C. ; Wetzel, J.T.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D4.1-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612